It should be mentioned that different processing schemes have also been proposed, based on correlation analysis [20] and synthetic spectra and optimization algorithms [21], but they, although based on the acquisition and analysis of the welding plasma spectra, leave aside the classical spectroscopic approach.In this paper we propose the use of the plasma spectrum root mean square RMS signal as an alternative on-line monitoring parameter. A similar approach has been initially explored by Wang et al. [22] for laser welding of titanium alloys by using a photodiode. In our system a CCD spectrometer is employed, and the plasma spectrum RMS signal is calculated by considering the intensity associated with all the pixels in the sensor.

With this approach it is possible to provide in real-time different spectroscopic monitoring parameters and, depending on the particular process, to use only one or to combine some of them under specific logic rules. Experimental arc-welding tests performed in the facilities of ITP (Industria de Turbo Propulsores S.A.), a company devoted to the fabrication of components for aeronautics, with both Inconel 718 and Titanium 6Al-4V specimens, will show the feasibility of the proposed solution. Results of visual and X-ray inspection of the seams and the possibility of classifying the different weld defects in terms of the spectroscopic parameters will be also discussed.2.

?Plasma Diagnostics Applied to On-Line Welding Anacetrapib MonitoringAs commented in the previous section, different spectroscopic monitoring parameters will be considered for Brefeldin_A the experimental analysis of the field tests.

First of all, the plasma electronic temperature Te can be determined by means of the Boltzmann-plot, which is derived from the Boltzmann equation [23]:ln(Imn ��mnAmn gm)=ln(hcNZ)?EmkTe(1)where Em is the upper level energy, gm the statistical weight, A the transition probability, ��mn the wavelength, Imn the emission line relative intensity, k the Boltzmann constant, h the Planck��s constant, c the light velocity, N the total population density of the element and Z the partition function. The representation of the left-hand side of Equation (1) versus Em has a slope inversely proportional to Te.

Several emission lines from the same species are considered in this case to obtain the Te profile, but this can be simplified by choosing only two lines and using Equation (2):Te=Em(2)?Em(1)kln[I(1)A(2)gm(2)��(1)I(2)A(1)gm(1)��(2)](2)Equation (2) is commonly employed for on-line welding monitoring, given its reduced computational cost. However, it is worth mentioning that the temperature profiles will be noisier with this approach, what can be a problem for this kind of application.